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Results 1 to 25 of 76

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Multilayers structure of HgCdTe solid solution after laser annealing without meltingSHEREGII, Eugen M; POCIASK, Małgorzata M; KUZMA, Marian et al.SPIE proceedings series. 2001, pp 45-49, isbn 0-8194-4116-3Conference Paper

Growth and characterization of multi-layered structures of GaAs, AlAs and AlGaAs by molecular Beam EpitaxyMATHEWS, Sen; CHALAPATHI, K; NARSALE, A et al.SPIE proceedings series. 2002, pp 1328-1331, isbn 0-8194-4500-2, 2VolConference Paper

Microbending loss and refractive index changes induced by transient thermal loading in double-coated optical fibers with thermal contact resistanceCHU, C.-L; LEE, H.-L; YANG, Y.-C et al.Applied physics. B, Lasers and optics (Print). 2009, Vol 97, Num 1, pp 109-115, issn 0946-2171, 7 p.Article

Thickness measurement of thin films and multilayers using Fourier transform of X-ray reflectivityTIWARI, U; SHARMA, R. K; SEHGAL, B. K et al.SPIE proceedings series. 2002, pp 1014-1017, isbn 0-8194-4500-2, 2VolConference Paper

Three-dimensional photonic microstructures produced by electric field assisted dissolution of metal nanoclusters in multilayer stacksJANICKI, V; SANCHO-PARRAMON, J; PEIRO, F et al.Applied physics. B, Lasers and optics (Print). 2010, Vol 98, Num 1, pp 93-98, issn 0946-2171, 6 p.Article

Interfacial peeling moments and shear forces at free edges of multilayers subjected to thermal stressesHSUEH, C. H; LUTTRELL, C. R; LEE, S et al.Journal of the American Ceramic Society. 2006, Vol 89, Num 5, pp 1632-1638, issn 0002-7820, 7 p.Article

Thermal stability of Gd2O3/Si(100) interfacial transition layerNOHIRA, H; YOSHIDA, T; OHMI, S et al.Journal de physique. IV. 2006, Vol 132, pp 273-277, issn 1155-4339, 5 p.Conference Paper

Early stage morphology of quench condensed Ag, Pb and Pb/Ag hybrid filmsZHENYI LONG; VALLES, James M.Journal of low temperature physics. 2005, Vol 139, Num 3-4, pp 429-438, issn 0022-2291, 10 p.Article

Analysis of SAW excitation and propagation under periodic metallic grating structuresHASHIMOTO, Ken-Ya; OMORI, Tatsuya; YAMAGUCHI, Masatsune et al.International journal of high speed electronics and systems. 2000, Vol 10, Num 3, pp 685-734Article

Mbe growth and interface formation of compound semiconductor heterostructures for optoelectronicsTOURNIDE, Eric; TRAMPERT, Achim.Physica status solidi. B. Basic research. 2007, Vol 244, Num 8, pp 2683-2696, issn 0370-1972, 14 p.Article

Influence of the spatial, temporal, and concentrational dependence of the diffusion coefficient on dopant dynamics : Optimization of annealing timePANKRATOV, E. L.Physical review B. Condensed matter and materials physics. 2005, Vol 72, Num 7, pp 075201.1-075201.8, issn 1098-0121Article

Kirkendall porosity during thermal treatment of Mo-Cu nanomultilayersSRINIVASAN, Dheepa; SUBRAMANIAN, P. R.Materials science & engineering. A, Structural materials : properties, microstructure and processing. 2007, Vol 459, Num 1-2, pp 145-150, issn 0921-5093, 6 p.Article

Analysis of biaxial strain in InN(0001) epilayers grown by molecular beam epitaxyDIMAKIS, E; DOMAGALA, J; ILIOPOULOS, E et al.Physica status solidi. A, Applications and materials science (Print). 2007, Vol 204, Num 6, pp 1996-1999, issn 1862-6300, 4 p.Conference Paper

Strain control and electrical properties of stripe-patterned Si /Si1-xGex /Si (100) heterostructuresUHM, Jangwoong; SAKURABA, Masao; MUROTA, Junjchi et al.Semiconductor science and technology. 2007, Vol 22, Num 1, issn 0268-1242, S33-S37Conference Paper

Investigation of a p-CuO/n-ZnO thin film heterojunction for H2 gas-sensor applicationsMRIDHA, S; BASAK, D.Semiconductor science and technology. 2006, Vol 21, Num 7, pp 928-932, issn 0268-1242, 5 p.Article

Si-oxide/Si and Si-oxynitride/Si interfaces analysed by ultra-low energy SIMSCWIL, M; KONARSKI, P; BIENIEK, T et al.Physica status solidi. A, Applications and materials science (Print). 2006, Vol 203, Num 9, pp 2200-2204, issn 1862-6300, 5 p.Conference Paper

Structural and mechanical responses of (Zr,Al)N/ZrB2 superlattice coatings to elevated-temperature annealing : Mechanical behaviour of micro- and nano-scale systemsLI, D. J; WANG, M. X; ZHANG, J. J et al.Materials science & engineering. A, Structural materials : properties, microstructure and processing. 2006, Vol 423, Num 1-2, pp 116-120, issn 0921-5093, 5 p.Conference Paper

The properties of GaInP/GaAs heterostructures as a function of growth temperaturePELOSI, C; ATTOLINI, G; BOSI, M et al.Journal de physique. IV. 2006, Vol 132, pp 315-319, issn 1155-4339, 5 p.Conference Paper

Bulk and surface acoustic waves in anisotropic solidsADLER, Eric L.International journal of high speed electronics and systems. 2000, Vol 10, Num 3, pp 653-684Article

Optimizing the planar structure of (111) Au/Co/Au trilayersKUMAH, D. P; CEBOLLADA, A; CLAVERO, C et al.Journal of physics. D, Applied physics (Print). 2007, Vol 40, Num 9, pp 2699-2704, issn 0022-3727, 6 p.Article

Epitaxial growth of P atomic layer doped Si film by alternate surface reactions of PH3 and Si2H6 on strained Si1-xGex/Si(100) in ultraclean low-pressure CVDCHIBA, Yohei; SAKURABA, Masao; MUROTA, Junichi et al.Semiconductor science and technology. 2007, Vol 22, Num 1, issn 0268-1242, S118-S122Conference Paper

Morphology of compressed dipalmitoyl phosphatidylcholine monolayers investigated by atomic force microscopyYANG, Yih-Pey; TSAY, Ruey-Yug.Journal of luminescence. 2007, Vol 127, Num 1, pp 186-191, issn 0022-2313, 6 p.Conference Paper

Structure and optical properties of the SiC/ZnO five-layer multi-layer on Si (111) substrate with a SiC buffer layerSHA, Z. D; YAN, Y; QIN, W. X et al.Journal of physics. D, Applied physics (Print). 2006, Vol 39, Num 15, pp 3240-3243, issn 0022-3727, 4 p.Article

Structure and stability of Pr2O3/Si(0 01) heterostructures grown by molecular beam epitaxy using a high temperature effusion sourceTINKHAM, B. P; TAKAHASI, M; JENICHEN, B et al.Semiconductor science and technology. 2006, Vol 21, Num 12, pp 1552-1556, issn 0268-1242, 5 p.Article

III-Nitrides semiconductor compounds for microwave devicesDI FORTE-POISSON, M. A; MAGIS, M; SARAZIN, N et al.Physica status solidi. A. Applied research. 2006, Vol 203, Num 1, pp 185-193, issn 0031-8965, 9 p.Conference Paper

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